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SEMI E78-0998 (first published)
Subordinate Standards:
3 This Test Method describes methods for preparation of slices and wafers of the III-V compound semiconductors GaAs
The quality criteria and metrology methodology of the key modules such as TSV
SEMI MF576-0812 (Reapproved 1023)
Automation Basics StdPbc-0311 SEMI E78-0998 (first published)Course Description Automation Basics consists of sections that will help familiarize the learner with the rudimentary concepts associated with sensors, actuators, various controllers, and human machine interfaces used with automation systems. Presented in THORSs graphically rich and interactive learning format, this course will help employees identify various components and products that can commonly be seen within an automation system. Learning
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